NXP and Rohde & Schwarz have collaborated to conduct extensive testing of NXP’s latest automotive radar sensor reference design, based on NXP’s 28 nm RFCMOS radar one-chip system-on-chip (SoC) SAF85xx. The validation process involved engineers from both companies using the R&S RTS radar test system, which combines the R&S AREG800 automotive radar echo generator with the R&S QAT100 antenna mmW frontend. This system offers unique capabilities for simulating short-distance objects, superior RF performance, and advanced signal processing functions.
The partnership between NXP and Rohde & Schwarz aims to facilitate realistic testing of next-generation automotive radar applications, bringing the automotive industry closer to the vision of fully autonomous driving. NXP’s radar sensor reference design, made possible by the industry’s first 28 nm RFCMOS radar one-chip SoC family, is designed to address short, medium, and long-range radar applications, meeting challenging NCAP safety requirements and providing comfort functions for L2+ and L3 vehicles.
The R&S RTS radar test system plays a crucial role in verifying NXP’s radar sensor reference design. It is the only test system capable of fully characterizing radar sensors and generating radar echoes with object distances down to the airgap value of the radar being tested. The R&S RTS is a technically advanced test solution suitable for the entire automotive radar lifecycle, including development lab, hardware-in-the-loop (HIL), vehicle-in-the-loop (VIL), validation, and production application requirements. It can also emulate complex traffic scenarios for advanced driver assistance systems.
NXP will showcase the latest innovations in radar technology, including the automotive radar sensor reference design, at the CES 2024 trade show in Las Vegas from January 9 to 12, 2024. This event will provide industry professionals and enthusiasts with insights into the cutting-edge developments shaping the future of automotive radar technology.
In conclusion, the collaboration between NXP and Rohde & Schwarz signifies a significant advancement in automotive radar technology. The rigorous testing and validation of NXP’s radar sensor reference design using the R&S RTS radar test system demonstrate a commitment to achieving the highest standards of performance, safety, and innovation in the automotive industry. As the automotive landscape continues to evolve, such collaborations and advancements pave the way for next-generation autonomous driving solutions that have the potential to transform the future of mobility.
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